Elektronik: kredse og komponenter
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Thermal-Aware Testing of Digital VLSI Circuits and Systems
Udgivet af Taylor & Francis Ltd
ISBN
9780367607098
Om denne bog
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and i…
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Bogdetaljer
Forfatter
Santanu Chattopadhyay
Forlag
Taylor & Francis Ltd
Kategori
Elektronik: kredse og komponenter
ISBN-13
9780367607098
EAN
9780367607098
Format
Hæftet
Sprog
Engelsk
sider
118
Produktbeskrivelse
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
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