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Electron and Ion Microscopy and Microanalysis
Principles and Applications, Second Edition,
Udgivet af Taylor & Francis Ltd
ISBN
9780367402945
Om denne bog
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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Bogdetaljer
Forlag
Taylor & Francis Ltd
Kategori
Optik
ISBN-13
9780367402945
EAN
9780367402945
Format
Hæftet
Sprog
Engelsk
sider
856
Undertitel
- Principles and Applications, Second Edition,
Produktbeskrivelse
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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